CppUTest

Overview

Lightweight C/C++ unit-testing framework designed specifically for embedded developers — small footprint, built-in mocking, memory-leak detection, and runs equally well on host and on target. Widely used in firmware TDD because it has no STL or exception dependencies.

Benefits

• Embedded-first design (no STL or exceptions required)
• Built-in mocking so no separate framework needed
• Cross-compiles to virtually any target
• Failure messages designed for terminal/CI workflows

Limitations & Risks

• Smaller community than GoogleTest or Catch2
• Macros can be terse for first-time users
• Mock framework is less expressive than gMock

Recommended Actions

Adopt for new firmware projects pursuing TDD; pair with a mock-generation script for HAL stubs; run host tests in CI on every PR and target tests when hardware is available.

Additional Notes

James Grenning's 'Test-Driven Development for Embedded C' is built around this framework. Pairs with #6 Embedded TDD.

References & Links

• https://cpputest.github.io/
• https://github.com/cpputest/cpputest